Analytical Testing & Services
| SI.No | Title | Division | Facility/Equipment | Method/Instrument | Charges for R&D Instt & SSI | Charges for Students | Charges for Industry | Charges for Internal Samples | Remark | Remark2 |
|---|---|---|---|---|---|---|---|---|---|---|
| 61 | Circular Dichroism Spectroscopy measurement | Chemical Sciences & Technology Division (CSTD) | Circular Dichroism Spectroscopy measurement | 1000/- for the first one hour + 500/- for additional hours | 1000/- for the first one hour + 500/- for additional hours | 2000/- for the first one hour + 1000/- for additional hours | 2000/- for the first one hour + 1000/- for additional hours |
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| 62 | PPMS Thermal Transport Option (TTO) Testing Charges /Hour | Materials Science & Technology Division (MSTD) | PPMS Thermal Transport Option (TTO) Testing Charges /Hour | PPMS Thermal Transport Option (TTO) Testing Charges /Hour | 4000 | 2000 | 8000 | Per Hour |
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| 63 | Model 8801 Wear & friction monitor DUCOM Instruments Model TR20LE | Materials Science & Technology Division (MSTD) | Model 8801 Wear & friction monitor DUCOM Instruments Model TR20LE | Model 8801 Wear & friction monitor DUCOM Instruments Model TR20LE | 1200 | 600 | 2400 | Per sample |
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| 64 | Micro-hardness tesing(clemex,js 2000) | Materials Science & Technology Division (MSTD) | Micro-hardness tesing(clemex,js 2000) | Micro-hardness tesing(clemex,js 2000) | 1350 | 680 | 2700 | Per sample |
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| 65 | Optical Metallography (Leica DMRX microscope with digital camera and material work station) |
Materials Science & Technology Division (MSTD) | Optical Metallography (Leica DMRX microscope with digital camera and material work station) |
Optical Metallography (Leica DMRX microscope with digital camera and material work station) |
1200 | 600 | 2400 | Per sample |
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| 66 | Dielectric Spectroscopy (1 mHz to 32 MHz) Solartron 1260 | Materials Science & Technology Division (MSTD) | Dielectric Spectroscopy (1 mHz to 32 MHz) Solartron 1260 | Dielectric Spectroscopy (1 mHz to 32 MHz) Solartron 1261 | 1200 | 600 | 2400 | Per sample |
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| 67 | Polarised Optical Microscope (Leica DM2700P with digital camera and software) | Materials Science & Technology Division (MSTD) | Polarised Optical Microscope (Leica DM2700P with digital camera and software) | Polarised Optical Microscope (Leica DM2700P with digital camera and software) | 1200 | 600 | 2400 | Per sample |
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| 68 | Thermo gravimetric/Differential thermal analyzer- analysis Diamond TG/DTA Perkin Elmer | Materials Science & Technology Division (MSTD) | Thermo gravimetric/Differential thermal analyzer- analysis Diamond TG/DTA Perkin Elmer | Thermo gravimetric/Differential thermal analyzer- analysis Diamond TG/DTA Perkin Elmer | 4350 | 2180 | 8700 | Per sample |
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| 69 | Surface area Analyzer Tristar 3000-BET | Materials Science & Technology Division (MSTD) | Surface area Analyzer Tristar 3000-BET | Surface area Analyzer Tristar 3000-BET | 4500 | 2250 | 9000 | Per sample |
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| 70 | Stereomicroscope (Zeiss microscope with digital camera) | Materials Science & Technology Division (MSTD) | Stereomicroscope (Zeiss microscope with digital camera) | Stereomicroscope (Zeiss microscope with digital camera) | 1200 | 600 | 2400 | Per sample |
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| 71 | Trace Element analysis AAS | Materials Science & Technology Division (MSTD) | Trace Element analysis AAS | 1890 | 1500 | 3780 | Per Hour |
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| 72 | PPMS Vibrating Sample Magnetometry (VSM)Testing Charges /Hour | Materials Science & Technology Division (MSTD) | PPMS Vibrating Sample Magnetometry (VSM)Testing Charges /Hour | PPMS Vibrating Sample Magnetometry (VSM)Testing Charges /Hour | 3000 | 1500 | 6000 | Per sample |
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| 73 | SEM-EDS With X-ray dot mapping | Materials Science & Technology Division (MSTD) | SEM-EDS With X-ray dot mapping | SEM-EDS With X-ray dot mapping | 10800 | 5400 | 21600 | Per sample |
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| 74 | SEM-EDS Two frame analysis | Materials Science & Technology Division (MSTD) | SEM-EDS Two frame analysis | 4500 | 2250 | 9000 | Per sample |
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| 75 | Scanning Electron Microscopy (SEM) | Materials Science & Technology Division (MSTD) | Scanning Electron Microscopy (SEM) | Scanning Electron Microscopy (SEM) | 4500 | 2250 | 9000 | Per sample |
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| 76 | Ferroelectric P-E Measurement | Materials Science & Technology Division (MSTD) | Ferroelectric P-E Measurement | 3000 | 1500 | 6000 | Per sample |
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| 77 | Screen and Stencil Printing (without consumables like patterned screen, conductive ink etc) | Materials Science & Technology Division (MSTD) | Screen and Stencil Printing (without consumables like patterned screen, conductive ink etc) | Screen and Stencil Printing (without consumables like patterned screen, conductive ink etc) | 4000 | 2500 | 8000 | Per sample |
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| 78 | Isostatic Lamination Pressing | Materials Science & Technology Division (MSTD) | Isostatic Lamination Pressing | 2000 | 1000 | 4000 | Per sample |
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| 79 | Brinell/Vickers Hardness Testing; Imported hardness tester INDENTEC,UK roughness, fatigue etc;10 to Dynamic testing machine Instron, UK |
Materials Science & Technology Division (MSTD) | Brinell/Vickers Hardness Testing; Imported hardness tester INDENTEC,UK roughness, fatigue etc;10 to Dynamic testing machine Instron, UK |
Brinell/Vickers Hardness Testing; Imported hardness tester INDENTEC,UK roughness, fatigue etc;10 to Dynamic testing machine Instron, UK |
10800 | 5400 | 21600 | Per sample |
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| 80 | Rheometer | Materials Science & Technology Division (MSTD) | Rheometer | 2040 | 1360 | 4080 | Per programme |
Analytical Testing & Services Coordinator's Address
Mr. Chandrakanth CK,
Sr.Principal Scientist,
Analytical Testing and Services Coordinator,
CSIR-NIIST, pappanamcode, Thiruvananthapuram - 695019,
Telephone. : +91-471-2515477 / 2515439 E-Mail: chandra[at]niist[dot]res[dot]in
